Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

(Nanowerk News) SEMATECH announced today that researchers have reached a significant milestone in reducing tool-generated defects from multi-layer deposition of mask blanks used for extreme ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

Positron Annihilation Spectroscopy (PAS) is a highly sensitive, non-destructive method for probing atomic-scale imperfections in a broad spectrum of materials, from metals and ceramics to polymers and ...

Lead halide perovskites can be turned into optoelectronic devices through low-cost solution depositions, but these approaches often leave numerous charge-trapping defects in the perovskite.